Title : 
Automatic insertion of fault-tolerant structures at the RT level
         
        
            Author : 
Entrena, Luis ; Lopez, Carlos ; Olías, Emilio
         
        
            Author_Institution : 
Electron. Technol. Area, Univ. Carlos III de Madrid, Spain
         
        
        
        
        
        
            Abstract : 
Historically, there has been a lack of CAD tools for the design of on-line testable circuits. As a consequence, the design of on-line testable circuits is currently being made manually to a large extent. In this paper we propose a new tool for the automatic insertion of fault-tolerant structures in an HDL synthesizable description of the design. With this tool, a fault-tolerant version of the design can be automatically produced according to the user specifications. The resulting fault-tolerant design is also described in an HDL and can be simulated and synthesized with commercial tools. Examples are shown to demonstrate the capabilities of this approach
         
        
            Keywords : 
cellular arrays; fault tolerant computing; hardware description languages; high level synthesis; integrated circuit design; redundancy; CAD tools; RT level; VHDL; automatic insertion; design productivity; fault-tolerant structures; on-line testable circuits; redundancy techniques; synthesizable description; Circuit faults; Circuit synthesis; Circuit testing; Design automation; Fault tolerance; Hardware design languages; Logic testing; Productivity; Redundancy; Safety;
         
        
        
        
            Conference_Titel : 
On-Line Testing Workshop, 2001. Proceedings. Seventh International
         
        
            Conference_Location : 
Taormina
         
        
            Print_ISBN : 
0-7695-1290-9
         
        
        
            DOI : 
10.1109/OLT.2001.937817