Title :
Combining model development with characterization
Author :
Scharfetter, D. ; Duvall, S.
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
The authors demonstrate the advantages of combining model characterization with model development and implementation. Examples cover process and device simulators, compact models for circuit simulators, and statistical models for design verification of IC devices. Situations in which combining model characterization with design could have avoided miscorrelations identified during design verification are discussed.<>
Keywords :
integrated circuit technology; semiconductor device models; semiconductor process modelling; simulation; IC devices; circuit simulators; compact models; design verification; device simulators; model characterization; model development; process simulators; statistical models; Certification; Circuit simulation; Circuit testing; Design engineering; Educational institutions; Integrated circuit modeling; Manufacturing processes; Predictive models; Process design; Product design;
Conference_Titel :
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-0243-5
DOI :
10.1109/IEDM.1991.235260
