DocumentCode
3301731
Title
High resolution optical lithography system using oblique incidence illumination
Author
Matsuo, S. ; Komatsu, K. ; Takeuchi, Y. ; Tamechika, E. ; Mimura, Y. ; Harada, K.
Author_Institution
NTT LSI Labs., Kanagawa, Japan
fYear
1991
fDate
8-11 Dec. 1991
Firstpage
970
Lastpage
972
Abstract
The authors propose a novel optical lithography system that has a resolving power more than 1.6 times higher than the resolving power of conventional projection systems. This system offers the superior practical advantage of using conventional masks without phase shifters. The authors explain the principle of the system and present its experimental confirmation. Possible applications to advanced processes are also mentioned. The combination of the optical system with an i-line and KrF excimer laser source will most probably be the lithography method used for 64 M and 245 M DRAM (dynamic RAM) processes.<>
Keywords
integrated circuit technology; photolithography; DRAM processes; KrF excimer laser source; conventional masks; dynamic RAM; oblique incidence illumination; optical lithography system; Apertures; Diffraction; Lenses; Lighting; Lithography; Optical filters; Resists; Spatial resolution; Telephony; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location
Washington, DC, USA
ISSN
0163-1918
Print_ISBN
0-7803-0243-5
Type
conf
DOI
10.1109/IEDM.1991.235262
Filename
235262
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