• DocumentCode
    3301731
  • Title

    High resolution optical lithography system using oblique incidence illumination

  • Author

    Matsuo, S. ; Komatsu, K. ; Takeuchi, Y. ; Tamechika, E. ; Mimura, Y. ; Harada, K.

  • Author_Institution
    NTT LSI Labs., Kanagawa, Japan
  • fYear
    1991
  • fDate
    8-11 Dec. 1991
  • Firstpage
    970
  • Lastpage
    972
  • Abstract
    The authors propose a novel optical lithography system that has a resolving power more than 1.6 times higher than the resolving power of conventional projection systems. This system offers the superior practical advantage of using conventional masks without phase shifters. The authors explain the principle of the system and present its experimental confirmation. Possible applications to advanced processes are also mentioned. The combination of the optical system with an i-line and KrF excimer laser source will most probably be the lithography method used for 64 M and 245 M DRAM (dynamic RAM) processes.<>
  • Keywords
    integrated circuit technology; photolithography; DRAM processes; KrF excimer laser source; conventional masks; dynamic RAM; oblique incidence illumination; optical lithography system; Apertures; Diffraction; Lenses; Lighting; Lithography; Optical filters; Resists; Spatial resolution; Telephony; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0243-5
  • Type

    conf

  • DOI
    10.1109/IEDM.1991.235262
  • Filename
    235262