Title :
Smart temperature sensor for on-line monitoring in automotive applications
Author :
Merino, J.L. ; Bota, S.A. ; Herms, A. ; Samitier, J. ; Cabruja, E. ; Jordà, X. ; Vellvehí, M. ; Bausells, J. ; Ferré, A. ; Bigorra, J.
Author_Institution :
Departament d´´Electronica, Barcelona Univ., Spain
Abstract :
This paper presents a system suitable for DfTT (Design for Thermal Testability) purposes that allows temperature monitoring and programmable overtemperature detection implemented in CMOS technology. It has been developed for on-line monitoring in automotive applications. The system includes a temperature sensor, based on the Base-emitter Voltage of a CMOS Lateral Bipolar Transistor, that achieves a non-linearity lower than 0,4°C in the range comprised between [-40°C, 85°C]. The system is compatible with the Boundary Scan protocol. The chip functions are discussed in detail
Keywords :
CMOS integrated circuits; automotive electronics; bipolar transistors; boundary scan testing; design for testability; intelligent sensors; monitoring; temperature sensors; -40 to 85 C; CMOS lateral bipolar transistor; automotive electronics; boundary scan protocol; design for thermal testability; on-line monitoring; programmable overtemperature detection; smart temperature sensor; temperature monitoring; Automotive applications; Automotive engineering; Bipolar transistors; CMOS technology; Monitoring; Protocols; System testing; Temperature measurement; Temperature sensors; Voltage;
Conference_Titel :
On-Line Testing Workshop, 2001. Proceedings. Seventh International
Conference_Location :
Taormina
Print_ISBN :
0-7695-1290-9
DOI :
10.1109/OLT.2001.937831
