• DocumentCode
    3301842
  • Title

    Optoelectronic integrated circuit grown on Si using selective regrowth by MOCVD

  • Author

    Egawa, T. ; Jimbo, T. ; Umeno, M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nagoya Inst. of Technol., Japan
  • fYear
    1991
  • fDate
    8-11 Dec. 1991
  • Firstpage
    953
  • Lastpage
    955
  • Abstract
    The authors report the first fabrication of a monolithically integrated AlGaAs/GaAs laser and GaAs MESFET grown on a GaAs/Si substrate using selective regrowth by MOCVD (metal-organic chemical vapor deposition). The schematic cross-sectional structure of monolithic integration of AlGaAs/GaAs laser and GaAs MESFET on a GaAs/Si substrate grown at 750 degrees C by MOCVD is shown. The drain I-V characteristic of the selective-regrown MESFET is also shown together with the drain I-V characteristic of the MESFET which is connected in series with the laser. This new type of OEIC (optoelectronic integrated circuit) is very promising in future applications such as optical interconnection.<>
  • Keywords
    Schottky gate field effect transistors; chemical vapour deposition; gallium arsenide; integrated optoelectronics; optical interconnections; semiconductor growth; semiconductor lasers; silicon; 750 degC; AlGaAs-GaAs laser; GaAs MESFET; GaAs-Si substrate; MOCVD; OEIC; chemical vapor deposition; drain I-V characteristic; fabrication; metal-organic CVD; monolithic integration; monolithically integrated; optical interconnection; optoelectronic integrated circuit; selective regrowth; semiconductor lasers; Application specific integrated circuits; Chemical lasers; Chemical vapor deposition; Gallium arsenide; MESFETs; MOCVD; Monolithic integrated circuits; Optical device fabrication; Optoelectronic devices; Photonic integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0243-5
  • Type

    conf

  • DOI
    10.1109/IEDM.1991.235268
  • Filename
    235268