Fault diagnosis for linear analog circuits with symbolic analysis and reduced observable point set

The paper is intended to propose a simple method to locate and identify, single (and multiple, under some hypothesis) faults in linear electric circuits. Key points of the method are: (1) a simple idea for an easy implementation, (2) a formulation based on symbolic analysis to use the feature of automatically generating equations and its ability to incorporate "non-conventional" algebra, (3) an extension to the interval algebra to take into account parameter tolerances and uncertainties for real circuits, (4) the need of few observable test points to meet real testing requirements as far as possible. The focus is primarily kept on the mathematical formulation, relating to the symbolic approach and the intervals