Title :
European Test Workshop 1999 (Cat. No.PR00390)
Abstract :
Presents the front cover of the proceedings.
Keywords :
automatic testing; built-in self test; design for testability; fault simulation; integrated circuit testing; logic testing; production testing; ATPG; BIST; FPGA test; IDDQ testing; MEMS; analog circuits; defect oriented test; delay faults; fault coverage; fault modelling; fault simulation; functional testing; industrial experiences; low power circuits; sequential circuits; structural testing; switched capacitors;
Conference_Titel :
European Test Workshop 1999. Proceedings
Conference_Location :
Constance, Germany
Print_ISBN :
0-7695-0390-X
DOI :
10.1109/ETW.1999.803817
