Fabrication of tuning-fork based AFM and STM tungsten probe

Author

Al-Falih, H. ; Khan, Yasin ; Zhang, Yaping ; San-Roman-Alerigi, Damain Pablo ; Cha, Dongkyu ; Ooi, Boon Siew ; Ng, Tien Khee

Author_Institution

Div. of Phys. Sci. & Eng., King Abdullah Univ. of Sci. & Technol. (KAUST), Thuwal, Saudi Arabia

fYear

2011

fDate

19-21 Dec. 2011

Firstpage

190

Lastpage

192

Abstract

We compare the sharpness of tungsten probe tips produced by the single-step and two-step dynamic electrochemical etching processes. A small radius of curvature (RoC) of 25 nm or less was routinely obtained when the two-step electrochemical etching (TEE) process was adopted, while the smallest achievable RoC was ~10 nm, rendering it suitable for atomic force microscopy (AFM) or scanning tunneling microscopy (STM) applications.

Keywords

atomic force microscopy; electrochemical analysis; etching; scanning tunnelling microscopy; tungsten; vibrations; STM; W; atomic force microscopy; curvature radius; radius 25 nm; rendering; scanning tunneling microscopy; single-step dynamic electrochemical etching process; tungsten probe sharpness; tuning-fork based AFM; two-step dynamic electrochemical etching process; Anodes; Atomic measurements; Cathodes; Etching; Tungsten probe; atomic force microscopy; electrochemical etching; scanning tunneling microscopy; tuning-fork;

fLanguage

English

Publisher

ieee

Conference_Titel

High Capacity Optical Networks and Enabling Technologies (HONET), 2011

Conference_Location

Riyadh

Print_ISBN

978-1-4577-1170-1

Type

conf

DOI

10.1109/HONET.2011.6149815

Filename

6149815