Title :
Fabrication of tuning-fork based AFM and STM tungsten probe
Author :
Al-Falih, H. ; Khan, Yasin ; Zhang, Yaping ; San-Roman-Alerigi, Damain Pablo ; Cha, Dongkyu ; Ooi, Boon Siew ; Ng, Tien Khee
Author_Institution :
Div. of Phys. Sci. & Eng., King Abdullah Univ. of Sci. & Technol. (KAUST), Thuwal, Saudi Arabia
Abstract :
We compare the sharpness of tungsten probe tips produced by the single-step and two-step dynamic electrochemical etching processes. A small radius of curvature (RoC) of 25 nm or less was routinely obtained when the two-step electrochemical etching (TEE) process was adopted, while the smallest achievable RoC was ~10 nm, rendering it suitable for atomic force microscopy (AFM) or scanning tunneling microscopy (STM) applications.
Keywords :
atomic force microscopy; electrochemical analysis; etching; scanning tunnelling microscopy; tungsten; vibrations; STM; W; atomic force microscopy; curvature radius; radius 25 nm; rendering; scanning tunneling microscopy; single-step dynamic electrochemical etching process; tungsten probe sharpness; tuning-fork based AFM; two-step dynamic electrochemical etching process; Anodes; Atomic measurements; Cathodes; Etching; Tungsten probe; atomic force microscopy; electrochemical etching; scanning tunneling microscopy; tuning-fork;
Conference_Titel :
High Capacity Optical Networks and Enabling Technologies (HONET), 2011
Conference_Location :
Riyadh
Print_ISBN :
978-1-4577-1170-1
DOI :
10.1109/HONET.2011.6149815
