Title :
A versatile polysilicon diaphragm pressure sensor chip
Author :
Chau, K.H.-L. ; Fung, C.D. ; Harris, P.R. ; Dahrooge, G.A.
Author_Institution :
Foxboro Co., MA, USA
Abstract :
A multidiaphragm piezoresistive pressure sensor with built-in front side over-pressure protection has been developed which is capable of simultaneous measurement of absolute and differential pressures over a wide range. The sensor chip has six polysilicon pressure sensing diaphragms, three of which measure differential pressures of -1 to 1, -5 to 5, and -30 to 30 psi: the remaining diaphragms measure absolute pressure against vacuum-sealed microcavities and have linear pressure ranges of 0 to 100, 0 to 500, and 0 to 2000 psi. Front side over-pressure protection is at least 6000 psi for every range. First-order temperature correction is achieved by using pressure-insensitive matching resistors. An additional temperature sensor provides on-chip temperature measurement and data for further digital compensation of the sensor array. The sensor chip has been characterized with full-scale output span ranges from 5mV/V for the 1 psi device to 62 mV/V for the 500 psi device. Hysteresis and nonrepeatability are typically within 0.1% of span. The chip thus offers pressure measuring capability over a wide range and the highest built-in over-pressure protection ever reported for a silicon pressure sensor.<>
Keywords :
compensation; electric sensing devices; micromechanical devices; piezoelectric transducers; pressure sensors; silicon; -30 to 2000 psi; 6000 psi; absolute pressure sensors; built-in front side over-pressure protection; differential pressure sensors; digital compensation; full-scale output span ranges; linear pressure ranges; multidiaphragm piezoresistive pressure sensor; nonrepeatability; on-chip temperature measurement; polycrystalline Si; polysilicon diaphragm pressure sensor; pressure-insensitive matching resistors; temperature compensation; temperature correction; temperature sensor; vacuum-sealed microcavities; Microcavities; Piezoresistance; Pressure measurement; Protection; Resistors; Semiconductor device measurement; Sensor arrays; Sensor phenomena and characterization; Temperature measurement; Temperature sensors;
Conference_Titel :
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-0243-5
DOI :
10.1109/IEDM.1991.235312