Title :
200-Gbit/s monolithic photodiode-electroabsorption modulator (PD-EAM) optical gate
Author :
Kodama, S. ; Ito, T. ; Watanabe, N. ; Kondo, S. ; Takeuchi, H. ; Ito, H. ; Ishibashi, T.
Author_Institution :
NTT Photonics Labs., Kanagawa, Japan
Abstract :
This paper presents optical demultiplexing (DEMUX) operation of a novel ultrafast optical gate that monolithically integrates a uni-traveling-carrier photodiode (UTC-PD) and an electroabsorption modulator (EAM). Adopting a traveling-wave (TW) design for the EAM together with the effective use of the nonlinear extinction characteristics of the EAM, the demultiplexing of optical RZ signals corresponding to a 200 Gbit/s data rate has been achieved with an extinction ratio of 18.6 dB.
Keywords :
demultiplexing equipment; digital communication; electro-optical modulation; electroabsorption; equivalent circuits; high-speed optical techniques; integrated optoelectronics; optical communication equipment; photodiodes; 200 Gbit/s; Gbit/s data rate; electroabsorption modulator; high extinction ratio; low interchannel crosstalk; monolithic PD-EAM; monolithic photodiode-EAM optical gate; nonlinear extinction characteristics; optical RZ signals; optical demultiplexing operation; traveling-wave design; ultrafast optical gate; uni-traveling-carrier photodiode; Demultiplexing; Extinction coefficients; Extinction ratio; Integrated optics; Nonlinear optics; Optical design; Optical modulation; Photodiodes; Signal design; Ultrafast optics;
Conference_Titel :
Device Research Conference, 2001
Conference_Location :
Notre Dame, IN, USA
Print_ISBN :
0-7803-7014-7
DOI :
10.1109/DRC.2001.937909
