DocumentCode
3303226
Title
High-temperature operation of mid-infrared (/spl lambda/=4-5 /spl mu/m) vertical and lateral InAs/GaAs/AlGaAs quantum dot infrared photodetectors
Author
Stiff, A.D. ; Krishna, S. ; Bhattacharya, P. ; Kennerly, S.
Author_Institution
Solid State Electron. Lab., Michigan Univ., Ann Arbor, MI, USA
fYear
2001
fDate
25-27 June 2001
Firstpage
155
Lastpage
156
Abstract
Infrared (IR) detection has sundry applications from military targeting systems to the observation of stellar phenomena to professional photography. It is desirable to develop a high temperature IR photon detection technology, which would lend itself more readily to lightweight, compact, inexpensive IR cameras. Intersubband quantum dot infrared photodetectors (QDIPs) have great promise for providing high-temperature normal incidence operation in the mid- and far-infrared ranges due to the favorable dynamics of hot carriers in quantum dots. In this paper, we present state-of-the-art results on vertical and lateral mid-infrared (λ= 4-5 μm) InAs/GaAs/AlGaAs QDIPs. To our knowledge, the vertical detector we have characterized has the lowest reported dark current for such a device (I/sub dark-vertical/=125 nA at V/sub b/=0.5 V for T=100 K). The lateral detector, which also has an extremely low dark current ( I/sub dark-lateral/=27 pA at V/sub b/=0.5 V for T=100 K), also has one of the highest operating temperatures (100 K) to be reported for such a device.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; high-temperature electronics; indium compounds; infrared detectors; semiconductor quantum dots; 100 K; 125 nA; 27 pA; 4 to 5 micron; IR cameras; InAs-GaAs-AlGaAs; InAs/GaAs/AlGaAs QDIPs; dark current; high-temperature operation; intersubband QDIPs; lateral quantum dot IR photodetectors; mid-infrared photodetectors; vertical quantum dot IR photodetectors; Cameras; Dark current; Hot carriers; Infrared detectors; Photodetectors; Photography; Photonics; Quantum dots; Space technology; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 2001
Conference_Location
Notre Dame, IN, USA
Print_ISBN
0-7803-7014-7
Type
conf
DOI
10.1109/DRC.2001.937911
Filename
937911
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