• DocumentCode
    3303329
  • Title

    Nano-transistor modeling: two dimensional Green´s function method

  • Author

    Svizhenko, A. ; Anantram, M.P. ; Govindan, T.R. ; Biegel, B.

  • Author_Institution
    NASA Ames Res. Center, Moffett Field, CA, USA
  • fYear
    2001
  • fDate
    25-27 June 2001
  • Firstpage
    167
  • Lastpage
    168
  • Abstract
    We have developed physical approximations and computer code capable of realistically simulating 2-D nanoscale transistors, using the non-equilibrium Green´s function (NEGF) method. This is the most accurate full quantum model yet applied to 2-D device simulation. Open boundary conditions and oxide tunneling are treated on an equal footing. Acoustic phonon scattering is included, causing transport to deviate from ballistic in a realistic manner. Electrons in the ellipsoids of the conduction band are treated within the anisotropic effective mass approximation. Self consistent solution of Poisson-NEGF equations is numerically intensive because of the number of spatial and energy coordinates involved. This makes the use of parallel/distributed computing imperative.
  • Keywords
    Green´s function methods; MOSFET; Poisson equation; SCF calculations; conduction bands; digital simulation; effective mass; electron-phonon interactions; high field effects; interface states; nanotechnology; quantum interference phenomena; semiconductor device models; tunnelling; 2-D device simulation; 2-D nanoscale transistors; 25 nm; 90 nm; MOSFET; Poisson-NEGF equations; acoustic phonon scattering; anisotropic effective mass approximation; ballistic current; computer code; conduction band; nano-transistor modeling; nonequilibrium Green´s function; open boundary conditions; oxide tunneling; parallel/distributed computing; self consistent solution; two dimensional Green´s function method; Acoustic devices; Acoustic scattering; Boundary conditions; Computational modeling; Computer simulation; Green´s function methods; Particle scattering; Phonons; Physics computing; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2001
  • Conference_Location
    Notre Dame, IN, USA
  • Print_ISBN
    0-7803-7014-7
  • Type

    conf

  • DOI
    10.1109/DRC.2001.937917
  • Filename
    937917