Title :
Hyhope : A Fast Fault Simulator With Efficient Simulation Of Hypertrophic Faults
Author :
Kung, Chen-Pin ; Lin, Chen-Shang
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Degradation; Discrete event simulation; Electrical fault detection; Fault detection; Fault diagnosis; Sequential circuits; Very large scale integration;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629901
