DocumentCode
3303470
Title
A Fast And Memory-efficient Diagnostic Fault Simulation For Sequential Circuits
Author
Jou, Jer Min ; Chen, Shung-Chih
fYear
1994
fDate
6-10 Nov 1994
Firstpage
723
Lastpage
726
Keywords
Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Flip-flops; Hafnium; Ovens; Power measurement; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1994., IEEE/ACM International Conference on
ISSN
1063-6757
Print_ISBN
0-8186-3010-8
Type
conf
DOI
10.1109/ICCAD.1994.629903
Filename
629903
Link To Document