DocumentCode :
3303495
Title :
An IGBT open-circuit fault detection method for modular multilevel converters
Author :
Binbin Li ; Yi Zhang ; Rongfeng Yang ; Gaolin Wang ; Dianguo Xu
Author_Institution :
Harbin Inst. of Technol., Harbin, China
fYear :
2015
fDate :
1-5 June 2015
Firstpage :
1573
Lastpage :
1578
Abstract :
Recently, the modular multilevel converter (MMC) has attracted increasing attentions due to its distinctive features, especially in the application of HVDC power transmission. One of the most significant characteristic of MMC is that it is composed of identical low-voltage submodules (SMs). As a result, the low-voltage IGBTs can be employed in each SM as the main power switch. However, since an MMC station usually contains hundreds of SMs, the IGBT becomes the most fragile component. In this paper, the failure characteristics of the IGBT open-circuit fault in a SM are firstly analyzed. Then, an observer-based IGBT open-circuit detection method is proposed, which can accurately detect the fault by comparing the estimated values with the actual sampled values. Finally, the validity and effectiveness of the proposed fault detection method are demonstrated by experimental results based on a single-phase MMC prototype in the laboratory.
Keywords :
HVDC power convertors; HVDC power transmission; fault diagnosis; power semiconductor switches; HVDC power transmission; IGBT open-circuit fault detection; failure characteristics; identical low-voltage submodules; modular multilevel converters; power switch; single-phase MMC prototype; Capacitors; Circuit faults; Converters; Current measurement; Fault detection; Insulated gate bipolar transistors; Voltage measurement; Fault detection; modular multilevel converter (MMC); open circuit fault; submodule (SM);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on
Conference_Location :
Seoul
Type :
conf
DOI :
10.1109/ICPE.2015.7167986
Filename :
7167986
Link To Document :
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