• DocumentCode
    3303638
  • Title

    A surrounding isolation-merged plate electrode (SIMPLE) cell with checkered layout for 256 Mbit DRAMs and beyond

  • Author

    Ozaki, T. ; Nitayama, A. ; Sunouchi, K. ; Takato, H. ; Takedai, S. ; Yagishita, A. ; Hieda, K. ; Horiguchi, F.

  • Author_Institution
    Toshiba Corp., Kawasaki, Japan
  • fYear
    1991
  • fDate
    8-11 Dec. 1991
  • Firstpage
    469
  • Lastpage
    472
  • Abstract
    The authors describe a novel cell structure called a surrounding isolation merged plate electrode (SIMPLE) cell. In this cell, close-packed silicon pillars are laid out checker-wise, and a thin isolation-merged plate electrode surrounds the pillars. This cell structure leads to cell area reduction to 50%, trench depth reduction to 50%, and planarization and process step reduction compared with the conventional trench type cell. Using the design rule of 64 Mbit DRAM (dynamic RAM) (0.35 mu m), the SIMPLE cell can achieve a cell area of 256 Mbit DRAM (0.5 mu m/sup 2/). The SIMPLE cell is an attractive candidate for 256 Mbit DRAMs and beyond.<>
  • Keywords
    DRAM chips; leakage currents; 0.35 micron; 256 Mbit; 64 Mbit; SIMPLE cell; Si pillars; cell area reduction; checkered layout; dynamic RAM; leakage current suppression; process step reduction; surrounding isolation-merged plate electrode; trench depth reduction; Capacitors; Electrodes; Etching; Fabrication; Lithography; Oxidation; Planarization; Random access memory; Silicon; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0243-5
  • Type

    conf

  • DOI
    10.1109/IEDM.1991.235354
  • Filename
    235354