• DocumentCode
    3304119
  • Title

    SPICE models and applications of superconducting FETs and higher-voltage Josephson gates

  • Author

    Ghoshal, U. ; Van Duzer, Theodore ; Kroger, H.

  • Author_Institution
    California Univ., Berkeley, CA, USA
  • fYear
    1991
  • fDate
    8-11 Dec. 1991
  • Firstpage
    349
  • Lastpage
    352
  • Abstract
    The authors describe the development of circuit models, applications of superconducting field effect transistors (SFETs), and higher-voltage Josephson junction (HVJJ) circuits which are important for the feasibility of several novel hybrid superconducting-semiconducting circuits. They also discuss the delay optimization involved in designing and embedding interface circuits in a hybrid superconductor-semiconductor technology. It is noted that, with the advances made in semiconductor technologies, interfaces between the two technologies are practical now and the advantages of hybrid circuits in various applications should be realizable in practice. In the case of interfacing typical Nb-based Josephson junction circuits to 0.5 mu m CMOS technologies, it was estimated that the minimum delay through the interface is approximately 110 ps and the optimum number of junctions in each branch of the HVJJ circuits is 10.<>
  • Keywords
    SPICE; equivalent circuits; modelling; superconducting junction devices; 0.5 micron; 110 ps; CMOS controlled superconducting FETs; CMOS technologies; HVJJ circuits; Nb; Nb-based Josephson junction circuits; SPICE models; circuit models; delay optimization; higher-voltage Josephson gates; higher-voltage Josephson junction; hybrid superconducting-semiconducting circuits; hybrid superconductor-semiconductor technology; interface circuits; minimum delay; optimum number of junctions; superconducting FETs; superconducting field effect transistors; Bandwidth; Critical current; FETs; Josephson junctions; Laboratories; MOSFETs; SPICE; SQUIDs; Superconducting logic circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0243-5
  • Type

    conf

  • DOI
    10.1109/IEDM.1991.235381
  • Filename
    235381