Beam focusing characteristics of the field emission arrays with parallel wedge emitter, gates and in-plane lens

Author

Yang, Chengfeng ; Zeng, Baoqing ; Yang, Zhonghai ; Qian, Shaigjie

Author_Institution

Beijing Vacuum Electron. Res. Inst., China

fYear

2002

fDate

17-19 Aug. 2002

Firstpage

114

Lastpage

117

Abstract

A focusing structure of field emission arrays (FEAs) made of parallel wedge emitter, gate and in-plane lens is suggested in this paper. Using the particle-in-cell (PIC) simulation code MAGIC, the wedge emitter, parallel gate and anode with and without in-plane lens have been simulated. The electron beam streamlines and the x-p_y phase shows that the in-plane lens focuses the electron beam. For a typical model the beam width will be decrease to about 1/8 for every cell, and the transverse velocity will decrease from ±3.1×10⁶ m/s to ±0.3×10⁶ m/s while adding the in-plane lens.

Keywords

electron beam focusing; electron field emission; electron lenses; finite difference time-domain analysis; simulation; vacuum microelectronics; 0.3×10⁶ m/s; 2D FDTD code; 3.1×10⁶ m/s; FEA; MAGIC; PIC simulation code; electron beam focusing characteristics; field emission arrays; focusing structure; in-plane lens; parallel gate; parallel wedge emitter; particle-in-cell simulation code; vacuum microelectronics; Anodes; Cathodes; Collimators; Electrodes; Electron beams; Electron emission; Field emitter arrays; Lenses; Strips; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on

Print_ISBN

0-7803-7486-X

Type

conf

DOI

10.1109/ICMMT.2002.1187648

Filename

1187648