Measuring the permittivity of thin samples in the X band: a thickness-independent technique

Author

Tedesco, Marco ; Olmi, Roberto ; Riminesi, Cristiano

Author_Institution

IFAC-Nello Carrara, CNR, Firenze, Italy

fYear

2002

fDate

17-19 Aug. 2002

Firstpage

118

Lastpage

121

Abstract

A new method is proposed for determining the permittivity of thin materials in the X band and estimating their thickness. The procedure consists of measuring two reflection coefficient values at the input of a waveguide modified to accommodate the material under measurement and then computing the unknown parameters by means of a numerical procedure employing a genetic algorithm. The method has been tested on certified dielectric materials and it can be successfully applied to materials whose thickness is not constant (i.e. leaves). Results concerning paper and thin cardboard are presented.

Keywords

genetic algorithms; microwave measurement; paper; permittivity measurement; thickness measurement; waveguides; X-band measurement; cardboard; dielectric materials; genetic algorithm; inversion problem; leaves; modified waveguide; numerical procedure; paper; permittivity measurement; reflection coefficient values; thickness measurements; thickness-independent technique; thin samples; waveguide measurement system; Biological materials; Biomedical materials; Biomedical measurements; Dielectric materials; Dielectric measurements; Electromagnetic waveguides; Equations; Permittivity measurement; Reflection; Thickness measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on

Print_ISBN

0-7803-7486-X

Type

conf

DOI

10.1109/ICMMT.2002.1187649

Filename

1187649