• DocumentCode
    3304365
  • Title

    Choice of calibration equations of the TSM method

  • Author

    Wang, You Lin ; Chen, Zhen Yu ; Zhu, Ning Hua

  • Author_Institution
    Inst. of Semicond., Acad. Sinica, Beijing, China
  • fYear
    2002
  • fDate
    17-19 Aug. 2002
  • Firstpage
    150
  • Lastpage
    153
  • Abstract
    For the reciprocal test fixtures, there are six independent S-parameters to be determined, and the thru-short-match (TSM) calibration can provide eight calibration equations. In this paper, the relation of calibration equations is investigated. It has been shown that the four equations obtained from the measurement with a transmission standard can be used simultaneously in the calibration. Experimental results show that the different choice of equations will lead to quite different solution, and the calibration accuracy can be improved by taking advantage of the established relation among the calibration equations and properly choosing calibration equations.
  • Keywords
    S-parameters; calibration; measurement standards; microwave measurement; network analysers; S-parameters; TSM method; calibration accuracy; calibration equations; reciprocal test fixtures; thru-short-match calibration; transmission standard; Calibration; Content addressable storage; Differential equations; Fixtures; Laboratories; Measurement standards; Metalworking machines; Reflection; Scattering parameters; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on
  • Print_ISBN
    0-7803-7486-X
  • Type

    conf

  • DOI
    10.1109/ICMMT.2002.1187657
  • Filename
    1187657