Title : 
High temperature operation (185 degrees C) of InGaAs/GaAs/InGaP quantum well lasers
         
        
            Author : 
Chen, Y.K. ; Wu, M.C. ; Kuo, J.M. ; Chin, M.A. ; Sergent, A.M.
         
        
            Author_Institution : 
AT&T Bell Lab. Murray Hill, NJ, USA
         
        
        
        
        
        
            Abstract : 
Aluminium-free InGaAs/GaAs/InGaP strained-layer quantum-well lasers have been grown on GaAs substrates by gas-source MBE (molecular beam epitaxy). High-temperature CW (continuous wave) operation of these (ridge waveguide lasers) has been demonstrated up to 185 degrees C, which is comparable to the best high-temperature laser performance in the strained-layer InGaAs/GaAs/AlGaAs quantum well lasers. Self-align index-guided lasers are also fabricated with gas-source MBE in two growth sequences. A threshold current of 12 mA is obtained from a 2.50- mu m-wide and 508- mu m-long self-aligned laser at room temperature under CW operation. This work demonstrates the regrowth capability of the gas source MBE technique to fabricate high-performance optoelectronic circuits and devices on the patterned aluminum-free InGaP layers.<>
         
        
            Keywords : 
III-V semiconductors; chemical beam epitaxial growth; gallium arsenide; gallium compounds; indium compounds; semiconductor growth; semiconductor lasers; 12 mA; 185 C; 2.5 micron; 508 micron; CW operation; GSMBE; GaAs substrates; InGaAs-GaAs-InGaP; gas-source MBE; high-temperature laser; self-aligned laser; semiconductors; strained-layer quantum-well lasers; threshold current; Circuits; Gallium arsenide; Gas lasers; Indium gallium arsenide; Molecular beam epitaxial growth; Quantum well lasers; Substrates; Temperature; Threshold current; Waveguide lasers;
         
        
        
        
            Conference_Titel : 
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
         
        
            Conference_Location : 
Washington, DC, USA
         
        
        
            Print_ISBN : 
0-7803-0243-5
         
        
        
            DOI : 
10.1109/IEDM.1991.235395