DocumentCode :
3304779
Title :
An advanced 0.4 mu m BiCMOS technology for high performance ASIC applications
Author :
Kirchgessner, J. ; Teplik, J. ; Ilderem, V. ; Morgan, D. ; Parmar, R. ; Wilson, S.R. ; Freeman, J. ; Tracy, C. ; Cosentino, S.
Author_Institution :
Motorola Inc., Mesa, AZ, USA
fYear :
1991
fDate :
8-11 Dec. 1991
Firstpage :
97
Lastpage :
100
Abstract :
An advanced 0.4 mu m BiCMOS technology has been developed for high-performance ASIC (application-specific integrated circuit) applications. The technology consists of a core 3.3 V CMOS process featuring 0.4 mu m effective channel lengths into which a high-performance n-p-n device module has been integrated. The ECL (emitter coupled logic) circuits are designed to operate with a conventional supply voltage of 5.2 V while the CMOS circuits are powered from an internally regulated 3.3 V supply. The n-p-n device features trench isolation and a self-aligned polysilicon emitter-base structure with a 0.4 mu m final emitter width. A peak Ft of 20 GHz and a minimum ECL delay of 41 ps at Ig=300 mu A have been achieved. This technology features silicided polysilicon local interconnection and up to 4 layers of metallization. A 51 mu m/sup 2/ 6T CMOS SRAM cell is available for applications requiring embedded SRAM.<>
Keywords :
BiCMOS integrated circuits; application specific integrated circuits; digital integrated circuits; emitter-coupled logic; integrated circuit technology; 0.4 micron; 3.3 V; 5.2 V; ASIC applications; BiCMOS technology; CMOS SRAM cell; application-specific integrated circuit; core 3.3 V CMOS process; effective channel lengths; embedded SRAM; emitter coupled logic; internally regulated 3.3 V supply; minimum ECL delay; multilevel metallisation; self-aligned polysilicon emitter-base structure; silicided polysilicon local interconnection; trench isolation; Application specific integrated circuits; BiCMOS integrated circuits; CMOS logic circuits; CMOS process; CMOS technology; Coupling circuits; Integrated circuit technology; Logic design; Logic devices; Random access memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location :
Washington, DC, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-0243-5
Type :
conf
DOI :
10.1109/IEDM.1991.235415
Filename :
235415
Link To Document :
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