DocumentCode
3304801
Title
Computing Folds and Bifurcations in current-Voltag Characteristics of Semiconductor Devices
Author
Grosse, E.
fYear
1992
fDate
31 May-1 Jun 1992
Firstpage
149
Lastpage
153
Keywords
Avalanche breakdown; Bifurcation; Computational modeling; Displays; Equations; Jacobian matrices; MOSFETs; Response surface methodology; Semiconductor devices; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Numerical Modeling of Processes and Devices for Integrated Circuits, 1992. NUPAD IV. Workshop on
Print_ISBN
0-7803-0516-7
Type
conf
DOI
10.1109/NUPAD.1992.674096
Filename
674096
Link To Document