Title :
Computing Folds and Bifurcations in current-Voltag Characteristics of Semiconductor Devices
fDate :
31 May-1 Jun 1992
Keywords :
Avalanche breakdown; Bifurcation; Computational modeling; Displays; Equations; Jacobian matrices; MOSFETs; Response surface methodology; Semiconductor devices; USA Councils;
Conference_Titel :
Numerical Modeling of Processes and Devices for Integrated Circuits, 1992. NUPAD IV. Workshop on
Print_ISBN :
0-7803-0516-7
DOI :
10.1109/NUPAD.1992.674096
