• DocumentCode
    3304804
  • Title

    Analysis and enhancement of software dynamic defect models

  • Author

    Yousef, A.H.

  • Author_Institution
    Comput. & Syst. Eng. Dept., Ain Shams Univ., Cairo
  • fYear
    2009
  • fDate
    24-25 March 2009
  • Firstpage
    85
  • Lastpage
    91
  • Abstract
    Dynamic defect models are used to estimate the number of defects in a software project, predict the release date and required effort of maintenance, and measure the progress and quality of development. The literature suggests that defects projection over time follows a Rayleigh distribution. In this paper, data concerning defects are collected from several software projects and products. Data projection showed that the previous assumption of the Rayleigh distribution is not valid for current projects which are much more complex. Empirical data collected showed that defect distribution in even simpler software projects cannot be represented by the Rayleigh curves due to the adoption of several types of testing on different phases in the project lifecycle. The findings of this paper enhance the well known Puntam´s defect model and propose new performance criteria to support the changes occurred during the project. Results of fitting and predicting the collected data show the superiority of the new enhanced defect model over the original defect model.
  • Keywords
    program testing; software maintenance; software reliability; Rayleigh curves; Rayleigh distribution; data concerning defects; data projection; project lifecycle; software dynamic defect models; software maintenance; software project; software testing; Bayesian methods; Predictive models; Shape; Software engineering; Software maintenance; Software measurement; Software performance; Software quality; System testing; Systems engineering and theory; Software Defect Models; software engineering empirical research;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Networking and Media Convergence, 2009. ICNM 2009. International Conference on
  • Conference_Location
    Cairo
  • Print_ISBN
    978-1-4244-3776-4
  • Electronic_ISBN
    978-1-4244-3778-8
  • Type

    conf

  • DOI
    10.1109/ICNM.2009.4907195
  • Filename
    4907195