Title :
Noise effects in RTD-fluxgate
Author :
Andd, B. ; Baelio, S. ; Sacco, V. ; Bulsara, A. ; In, V.
Author_Institution :
DIEES, Universita degli studi di Catania
fDate :
Oct. 30 2005-Nov. 3 2005
Abstract :
Models and an extensive set of theoretical findings of residence times difference (RTD) fluxgate have been already presented in previous papers. A very simple sensor structure, negligible onboard power requirements and the intrinsic digital form of the readout signal are the main features of the proposed strategy. In this paper we aim to investigate main sources of uncertainty, including noise, and possible strategies to limit their effects on the devices; finally results on noise characterization are presented
Keywords :
fluxgate magnetometers; noise measurement; noise effects; readout signal; residence times difference fluxgate; sensor structure; Coils; Magnetic cores; Magnetic fields; Magnetic noise; Magnetic sensors; Magnetization; Magnetometers; Potential energy; Space exploration; Uncertainty;
Conference_Titel :
Sensors, 2005 IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-9056-3
DOI :
10.1109/ICSENS.2005.1597854
