Study on commutation failure in an HVDC inverter

Author

Gang, Zou ; Jianchao, Zheng ; Chen Xiangxun

Author_Institution

Electr. Power Res. Inst., Beijing, China

Volume

1

fYear

1998

fDate

18-21 Aug 1998

Firstpage

503

Abstract

Commutation failures (CF) are very frequent dynamic events in HVDC power systems. In this paper, a simplified thyristor lumped-charge model is used to analyze the change of the stored charges in the device during turn-off and the commutation process in an HVDC inverter is studied theoretically. The influences of external circuit parameters, as well as thyristor device parameters on CF, are examined. Based on the removal process of the stored charges in thyristor devices, the duration of the phases in turn-off process of the device is given and a novel criterion of commutation failure is proposed

Keywords

DC-AC power convertors; HVDC power convertors; commutation; failure analysis; invertors; semiconductor device reliability; thyristor convertors; HVDC inverter; commutation failure; external circuit parameters; simplified thyristor lumped-charge model; stored charge; thyristor device parameters; turn-off process; Circuit faults; Circuit simulation; HVDC transmission; Inductance; Inverters; Power system modeling; Thyristors; Turning; Valves; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Power System Technology, 1998. Proceedings. POWERCON '98. 1998 International Conference on

Conference_Location

Beijing

Print_ISBN

0-7803-4754-4

Type

conf

DOI

10.1109/ICPST.1998.729014

Filename

729014