DocumentCode
3304971
Title
A probabilistic measurement model for local interest point based 6 DOF pose estimation
Author
Grundmann, Thilo ; Eidenberger, Robert ; Wichert, Georg V.
Author_Institution
Autonomous Syst., Corp. Technol., Siemens AG, Munich, Germany
fYear
2010
fDate
18-22 Oct. 2010
Firstpage
4572
Lastpage
4577
Abstract
The ability to recognize objects and to localize them precisely is essential in all service robotic applications. One of the main challenges for service robots during operation lies in the handling of unavoidable uncertainties which originate from model and sensor inaccuracies and are characteristic for realistic application scenarios. Robustness under real world conditions can only be achieved when the dominant uncertainties are explicitly represented and purposefully managed by the robot´s control system. We therefore adopt a probabilistic approach in which environment perception over time is regarded as a sequential estimation process and follow a Bayesian filtering methodology. Under these assumptions probabilistic models of the robot´s perception systems play a decisive role. In this paper we describe our object localization system which is based on local features and uses 3D models that are created in an off-line modeling process. A probabilistic model of the errors, which occur in the 6D localization based on local features, is directly derived from the pose reconstruction procedure. Experimental results from an household scenario illustrate the effectiveness of our approach.
Keywords
Bayes methods; feature extraction; filtering theory; image reconstruction; manipulators; object recognition; pose estimation; robot vision; service robots; solid modelling; 3D model; 6 DOF pose estimation; Bayesian filtering; local interest point; object localization system; object recognition; off-line modeling process; pose reconstruction; probabilistic measurement model; sensor inaccuracy; sequential estimation; service robot;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Robots and Systems (IROS), 2010 IEEE/RSJ International Conference on
Conference_Location
Taipei
ISSN
2153-0858
Print_ISBN
978-1-4244-6674-0
Type
conf
DOI
10.1109/IROS.2010.5649799
Filename
5649799
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