DocumentCode
3305160
Title
International Electron Devices Meeting 1991. Technical Digest [Front Cover]
fYear
1991
fDate
8-11 Dec. 1991
Abstract
Presents the front cover from the conference proceedings.
Keywords
BiCMOS integrated circuits; CMOS integrated circuits; bipolar integrated circuits; detectors; digital integrated circuits; display devices; electron tubes; integrated circuit technology; integrated circuits; integrated memory circuits; lithography; metallisation; micromechanical devices; monolithic integrated circuits; optoelectronic devices; reliability; semiconductor device models; semiconductor devices; semiconductor lasers; semiconductor technology; vacuum microelectronics; BiCMOS; CMOS process integration; DRAM; IC technologies; SRAM; advanced memory technology; bipolar technology; compact models; detectors; electron beam technology; fast wave electronics; gate dielectrics; heterojunction bipolar devices; heterojunction quantum devices; hot carrier modelling; interconnect technologies; lithography; micromachined devices; monolithic IC; nonvolatile memory; relativistic electronics; semiconductor lasers; semiconductors; vacuum microelectronics;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location
Washington, DC, USA
ISSN
0163-1918
Print_ISBN
0-7803-0243-5
Type
conf
DOI
10.1109/IEDM.1991.235437
Filename
235437
Link To Document