DocumentCode :
3305274
Title :
Design methodology and practice of VLSI functional test synthesis
Author :
Hudec, Ján
Author_Institution :
Dept. of Comput. Sci. & Eng., Slovak Univ. of Technol., Bratislava, Slovakia
fYear :
2001
fDate :
19-22 June 2001
Firstpage :
461
Abstract :
The paper presents a methodology overview for test synthesis of VLSI and ASIC systems using an automated process of VHDL synthesis simultaneously with Automatic Functional Test Generator (AFTG). The determination of the test efficiency of instruction mixes is discussed.
Keywords :
VLSI; application specific integrated circuits; automatic test software; hardware description languages; AFTG; ASIC systems; Automatic Functional Test Generator; VHDL synthesis; VLSI functional test synthesis; automated process; design methodology; instruction mixes; methodology overview; test efficiency; Application specific integrated circuits; Automatic testing; Circuit testing; Design automation; Design methodology; Electronic equipment testing; Integrated circuit synthesis; Production; System testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Technology Interfaces, 2001. ITI 2001. Proceedings of the 23rd International Conference on
ISSN :
1330-1012
Print_ISBN :
953-96769-3-2
Type :
conf
DOI :
10.1109/ITI.2001.938056
Filename :
938056
Link To Document :
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