A highly temperature-stable MAGFET array for CMOS smart rotary encoders

Author

Nakano, Kazuhiro ; Takahashi, Toru ; Kawahito, Shoji

Author_Institution

Graduate Sch. of Electron. Sci. & Technol., Shizuoka Univ., Hamamatsu

fYear

2005

fDate

Oct. 30 2005-Nov. 3 2005

Abstract

Temperature stability is one of the major concerns of sensors for practical applications. This paper presents a method for improving the temperature stability of CMOS magnetic rotary encoders. The main factor of the offset drift is the piezoresistive effect due to the stress induced by packaging. A connection of four MAGFET elements offers a good offset drift cancellation capability while keeping the sensitivity. Using the proposed method, the offset drift is reduced from 0.4% without the cancellation to 0.15% with cancellation under the temperature range of 5degC to 80degC

Keywords

CMOS integrated circuits; field effect transistors; high-temperature electronics; intelligent sensors; magnetic sensors; piezoresistive devices; thermal stability; 5 to 80 C; CMOS magnetic rotary encoders; CMOS smart rotary encoders; high temperature MAGFET array; packaging induced stress; piezoresistive effect; temperature stability; Magnetic circuits; Magnetic sensors; Mechanical sensors; Noise reduction; Sensor arrays; Signal resolution; Stability; Stress; Temperature distribution; Temperature sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Sensors, 2005 IEEE

Conference_Location

Irvine, CA

Print_ISBN

0-7803-9056-3

Type

conf

DOI

10.1109/ICSENS.2005.1597884

Filename

1597884