Title :
A highly temperature-stable MAGFET array for CMOS smart rotary encoders
Author :
Nakano, Kazuhiro ; Takahashi, Toru ; Kawahito, Shoji
Author_Institution :
Graduate Sch. of Electron. Sci. & Technol., Shizuoka Univ., Hamamatsu
fDate :
Oct. 30 2005-Nov. 3 2005
Abstract :
Temperature stability is one of the major concerns of sensors for practical applications. This paper presents a method for improving the temperature stability of CMOS magnetic rotary encoders. The main factor of the offset drift is the piezoresistive effect due to the stress induced by packaging. A connection of four MAGFET elements offers a good offset drift cancellation capability while keeping the sensitivity. Using the proposed method, the offset drift is reduced from 0.4% without the cancellation to 0.15% with cancellation under the temperature range of 5degC to 80degC
Keywords :
CMOS integrated circuits; field effect transistors; high-temperature electronics; intelligent sensors; magnetic sensors; piezoresistive devices; thermal stability; 5 to 80 C; CMOS magnetic rotary encoders; CMOS smart rotary encoders; high temperature MAGFET array; packaging induced stress; piezoresistive effect; temperature stability; Magnetic circuits; Magnetic sensors; Mechanical sensors; Noise reduction; Sensor arrays; Signal resolution; Stability; Stress; Temperature distribution; Temperature sensors;
Conference_Titel :
Sensors, 2005 IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-9056-3
DOI :
10.1109/ICSENS.2005.1597884
