DocumentCode :
3305591
Title :
Surveys and analysis of rfi in the smos context
Author :
Skou, Niels ; Balling, Jan E. ; Sobjarg, Sten S. ; Kristensen, Steen S.
Author_Institution :
Danish Nat. Space Center, Tech. Univ. of Denmark, Lyngby, Denmark
fYear :
2010
fDate :
25-30 July 2010
Firstpage :
2011
Lastpage :
2014
Abstract :
Several soil moisture and sea salinity campaigns, including airborne L-band radiometer measurements, have been carried out in preparation for the ESA Soil Moisture and Ocean Salinity (SMOS) mission. The radiometer used in this context is fully polarimetric and is capable of detecting Radio Frequency Interference (RFI) using the kurtosis method. Analyses have shown that the kurtosis method generally detects RFI in an efficient manner, even though it has its shortcomings. Hence, other detection methods have been investigated as well. In particular, inspection of the 3rd and 4th Stokes parameters shows promising results possibly as a complement to the kurtosis method. The kurtosis method, however, cannot be used with SMOS data. Since SMOS is fully polarimetric, the 3rd and 4th Stokes parameter method is an option, and this has been used on a recent, fully polarimetric SMOS data set. Finally, a discussion of the variable incidence angle signature algorithm, and the possibility of using this as RFI indicator, is carried out.
Keywords :
moisture; oceanographic techniques; radiofrequency interference; radiometers; soil; 3rd stokes parameter inspection; 4th stokes parameter inspection; European Space Agency soil moisture; airborne L-band radiometer measurement; kurtosis method; ocean salinity; radio frequency interference detection; sea salinity campaign; variable incidence angle signature algorithm; Algorithm design and analysis; Brightness temperature; Inspection; L-band; Microwave radiometry; Sensitivity; Stokes parameters; L-band; SMOS; kurtosis; microwave; radio-frequency interference (RFI); radiometer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
ISSN :
2153-6996
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
Type :
conf
DOI :
10.1109/IGARSS.2010.5649838
Filename :
5649838
Link To Document :
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