Title :
A Parallel Fault Simulator on a Multiprocessor
Author :
Bhattacharyya, U.K. ; Mohan, G. ; Gupta, I. Sen
Author_Institution :
Indian Institute of Technology
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer science; Fault detection; Logic testing; Paper technology; Parallel processing; Very large scale integration;
Conference_Titel :
TENCON '91.1991 IEEE Region 10 International Conference on EC3-Energy, Computer, Communication and Control Systems
Print_ISBN :
0-7803-0538-8
DOI :
10.1109/TENCON.1991.729642