• DocumentCode
    3305833
  • Title

    Silicon integrated injection logic operating above 350 degrees C

  • Author

    Sunayama, T. ; Kawakami, H. ; Migitaka, M.

  • Author_Institution
    Dept. of Inf. & Control Eng., Toyota Technol. Inst., Nagoya, Japan
  • fYear
    1991
  • fDate
    8-11 Dec. 1991
  • Firstpage
    161
  • Lastpage
    164
  • Abstract
    In order to develop silicon ICs operating above 350 degrees C, an integrated injection logic (IlL) was chosen as an example. A novel structure for the IIL was designed through experimental and theoretical studies of pn junctions and transistors at high temperatures. The designed IIL was achieved by newly developed combined processes of ion implantation and low-temperature epitaxy. The developed IIL is fully operational from room temperature to 385 degrees C. The V/sub OH/ decreases with temperature at the rate of 1.8 mV/ degrees C and is about 215 mV at 370 degrees C. V/sub OL/ does the same at about 45 mV in a temperature range from 50 to 370 degrees C. The signal swing of a nine-stage ring oscillator is about 30 mV at 385 degrees C. The power delay product is 18 pJ/stage.<>
  • Keywords
    bipolar integrated circuits; elemental semiconductors; integrated circuit technology; integrated injection logic; oscillators; silicon; 18 pJ; 30 to 385 C; I/sup 2/L; IIL; Si; high temperature electronics; integrated injection logic; ion implantation; low-temperature epitaxy; pn junctions; power delay product; ring oscillator; room temperature; semiconductors; signal swing; temperature range; threshold voltage; transistors; Control engineering; Epitaxial growth; Inverters; Leakage current; Logic; Low voltage; Silicon; Substrates; Temperature distribution; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0243-5
  • Type

    conf

  • DOI
    10.1109/IEDM.1991.235476
  • Filename
    235476