DocumentCode :
3305867
Title :
Design criteria for high frequency, ultra high di/dt MAGTs
Author :
Shinohe, Takashi ; Yahata, Akihiro ; Atsuta, Masaki ; Minami, Yoshihiro ; Ohashi, Hiromichi
Author_Institution :
Toshiba Corp., Kawasaki, Japan
fYear :
1991
fDate :
8-11 Dec. 1991
Firstpage :
153
Lastpage :
156
Abstract :
2500-V MOS assisted gate triggered thyristors (MAGTs) have been proposed as promising devices for future pulsed power applications. It was successfully demonstrated that the device has extremely high turn-on capability, comparable to thyratrons. The MAGT high-frequency operation design criteria are shown here. The photoluminescence (PL) decay method was used to measure the actual carrier lifetime in MAGT devices. It reveals that an electron carrier lifetime more than half of the operating pulse width is sufficient to minimize the turn-on loss. This means that the pause period can be reduced while still retaining small turn-on loss. A simple model is presented to interpret the turn-on loss dependence on the N-base width. With the optimized devices, 5-kHz operation was successfully demonstrated.<>
Keywords :
semiconductor device models; thyristors; 2500 V; 5 kHz; MAGTs; MOS assisted gate triggered thyristors; N-base width; actual carrier lifetime; design criteria; electron carrier lifetime; high di/dt; high frequency; high-frequency operation; model; operating pulse width; operation; photoluminescence decay; pulsed power applications; turn-on capability; turn-on loss; Anodes; Charge carrier lifetime; Charge carrier processes; Extraterrestrial measurements; Frequency; Pulsed power supplies; Space vector pulse width modulation; Thyratrons; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International
Conference_Location :
Washington, DC, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-0243-5
Type :
conf
DOI :
10.1109/IEDM.1991.235478
Filename :
235478
Link To Document :
بازگشت