DocumentCode :
330604
Title :
Silicon Micromachining
Author :
Esashi, Masayoshi
Author_Institution :
Tohoku University
fYear :
1998
fDate :
13-16 July 1998
Firstpage :
3
Lastpage :
4
Abstract :
Advanced micro sensors for pressure, angular rate, ultrasonic imaging and atomic force have been realized based on silicon bulk-micromachining. Novel techniques as deep RIE, isotropic XeF2 silicon etching performs precise micromachining. Par(alle1 electrode structures enable capacitive sensing and electrostatic actuation for force balancing servo and resonance. 2. Pressure sensor and resonant gyro fabricated using deep RIE and XeF2 etching.
Keywords :
Atomic force microscopy; Electrodes; Electrostatic measurements; Etching; Force sensors; Micromachining; Probes; Resonance; Silicon; Slurries;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 1998 International
Conference_Location :
Kyoungju, South Korea
Print_ISBN :
4-930813-83-2
Type :
conf
DOI :
10.1109/IMNC.1998.729908
Filename :
729908
Link To Document :
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