Title :
Fingerprint reference point detemination based on a novel ridgeline feature
Author :
Xie, Shan Juan ; Yoo, Hyouck Min ; Park, Dong Sun ; Yoon, Sook
Author_Institution :
Sch. of Electron. Eng., Chonbuk Nat. Univ., Jeonju, South Korea
Abstract :
Different with a traditional orientation analysis or frequency analysis which is commonly used for the fingerprint reference point determination, a new fingerprint reference point determination method based on a novel inconsistency feature obtained from the relationship between ridgelines and curves of a fingerprint is proposed. For the proposed method, an improved enhancement method is introduced and the posterior probability theory is used to determine the reference point in pixel precision. Experimental results demonstrate its feasibility, validity and ability independent of the quality and types of fingerprints.
Keywords :
fingerprint identification; enhancement method; fingerprint reference point determination; probability theory; ridgeline feature; Databases; Estimation; Fingerprint recognition; Image matching; Labeling; Pixel; Fingerprint; connected component labeling; inconsistency characteristic; reference point;
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2010.5649869