• DocumentCode
    330608
  • Title

    Spatial And Temporal Radical Distribution In Inductively Coupled Plasma For SiO/sub 2/ Etching

  • Author

    Hayashi, S. ; Yamanaka, M. ; Kubota, M. ; Ogura, M.

  • Author_Institution
    Matsushita Electronics Corporation
  • fYear
    1998
  • fDate
    13-16 July 1998
  • Firstpage
    10
  • Lastpage
    11
  • Keywords
    Etching; Fluorescence; Optical coupling; Plasma applications; Plasma density; Plasma materials processing; Plasma measurements; Reflection; Spatial resolution; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 1998 International
  • Conference_Location
    Kyoungju, South Korea
  • Print_ISBN
    4-930813-83-2
  • Type

    conf

  • DOI
    10.1109/IMNC.1998.729916
  • Filename
    729916