DocumentCode

3306202

Title

Leakage Current Simulation of a CCD

Author

Toyabe, Toru ; Tanaka, H. ; Ono, H. ; Tokamatsu, K. ; Ando, H.

Author_Institution

Hitachi, Ltd.

fYear

1992

fDate

31 May-1 Jun 1992

Firstpage

205

Lastpage

206

Keywords

Absorption; Charge coupled devices; Doping; Electrons; Impurities; Laboratories; Leakage current; Lighting; Photodiodes; Surface resistance;

fLanguage

English

Publisher

ieee

Conference_Titel

Numerical Modeling of Processes and Devices for Integrated Circuits, 1992. NUPAD IV. Workshop on

Print_ISBN

0-7803-0516-7

Type

conf

DOI

10.1109/NUPAD.1992.674105

Filename

674105