Title :
Leakage Current Simulation of a CCD
Author :
Toyabe, Toru ; Tanaka, H. ; Ono, H. ; Tokamatsu, K. ; Ando, H.
Author_Institution :
Hitachi, Ltd.
fDate :
31 May-1 Jun 1992
Keywords :
Absorption; Charge coupled devices; Doping; Electrons; Impurities; Laboratories; Leakage current; Lighting; Photodiodes; Surface resistance;
Conference_Titel :
Numerical Modeling of Processes and Devices for Integrated Circuits, 1992. NUPAD IV. Workshop on
Print_ISBN :
0-7803-0516-7
DOI :
10.1109/NUPAD.1992.674105
