• DocumentCode
    3306296
  • Title

    System Level Modeling of Piezo-Resistive Pressure Sensors Including Technology Data and Parasitic Effects

  • Author

    Diener, K.H. ; Reitz, S. ; Schneider, P.

  • Author_Institution
    Div. of Design Autom., Fraunhofer Inst. for Integrated Circuits, Dresden
  • fYear
    2005
  • fDate
    Oct. 30 2005-Nov. 3 2005
  • Firstpage
    1282
  • Lastpage
    1285
  • Abstract
    Basically, integrated piezoresistive pressure sensors exhibit parasitic effects that have to be suppressed as necessary. To ensure the proper function of integrated sensing elements design-driven modeling and simulations have to be performed. This kind of modeling and simulation is extremely useful for determining operation characteristics and verifying sensor performance before manufacturing. Thus, the need for test iterations decreases. That is why, cost and time-to-market can be reduced significantly
  • Keywords
    piezoresistive devices; pressure sensors; semiconductor device models; parasitic effects; piezoresistive pressure sensor; sensor performance; system level modeling; Analytical models; Circuit simulation; Integrated circuit technology; Manufacturing processes; Mechanical sensors; Piezoresistance; Sensor phenomena and characterization; Sensor systems; Stress; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2005 IEEE
  • Conference_Location
    Irvine, CA
  • Print_ISBN
    0-7803-9056-3
  • Type

    conf

  • DOI
    10.1109/ICSENS.2005.1597941
  • Filename
    1597941