DocumentCode :
3306494
Title :
STEP to DMIS: Automated generation of inspection plans from CAD data
Author :
Sathi, S. Venkata Bhaskar ; Rao, P.V.M.
Author_Institution :
Dept. of Mech. Eng., Indian Inst. of Technol. Delhi, New Delhi, India
fYear :
2009
fDate :
22-25 Aug. 2009
Firstpage :
519
Lastpage :
524
Abstract :
The present work is concerned with automated generation of process plans for CMM based part inspection from CAD models. The importance and advantage of the proposed system is that it uses STEP (ISO 10303) file of the part to be inspected as an input and gives inspection process plan of the part as an output in DMIS (ISO 22903) format. This is the first time an effort has been made to integrate design and inspection using two international standards. This is made possible due to recent developments in STEP to incorporate part tolerance information which is essential for inspection automation. The Edition 2 of STEP AP 203 which was released recently has this provision. The inspection automation system proposed in this work has three automation modules. First module uses geometric and product information of part to identify surface features to be probed for inspection. Second module automates setup planning and probe selection accounting for feature accessibility. Probe path planning and generation of inspection plan are part of third automation module. The proposed system has been developed and tested for inspection automation of manufactured parts to be inspected in an industrial environment.
Keywords :
CAD; ISO standards; coordinate measuring machines; inspection; production engineering computing; CAD data; CAD model; CMM based part inspection; DMIS; ISO 10303; ISO 22903 format; STEP; automated generation; automation module; feature accessibility; industrial environment; inspection automation; inspection plan; inspection process plan; international standard; manufactured parts; part tolerance information; probe selection; setup planning; surface features; Automatic testing; Coordinate measuring machines; Data engineering; ISO standards; Inspection; Magnetic heads; Manufacturing automation; Path planning; Probes; System testing; Computer Aided Inspection; Coordinate Measuring Machine; DMIS; Inspection Automation; STEP;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation Science and Engineering, 2009. CASE 2009. IEEE International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-4578-3
Electronic_ISBN :
978-1-4244-4579-0
Type :
conf
DOI :
10.1109/COASE.2009.5234154
Filename :
5234154
Link To Document :
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