• DocumentCode
    3306503
  • Title

    Statistical analysis of blind-oversampling CDR circuits

  • Author

    Kolka, Zdenek ; Kubicek, M. ; Biolkova, Viera ; Biolek, Dalibor

  • Author_Institution
    Dept. of Radio Electron., Brno Univ. of Technol., Brno, Czech Republic
  • fYear
    2012
  • fDate
    3-5 Oct. 2012
  • Firstpage
    479
  • Lastpage
    483
  • Abstract
    The paper deals with two statistical simulation models for feed-forward blind-oversampling Clock and Data Recovery circuits, which determine the center of the data eye by observing the positions of edges in a data stream. The first model describes the traditional averaged phase picking method based on counting the edges in several domains, which divide the signal period. The second model was developed for a newly proposed CDR circuit, which selects the optimum sampling phase upon the occurrence of several consecutive edges in one sampling domain. Its simulation model is based on the periodic Markov chain representation of the domain-selection process. The averaged Bit-Error Rate can be simply computed from the steady-state of the chain. The computational complexity of statistical models is determined by the added jitter properties rather than by the actual level of bit-error rate. The models include random jitter, sinusoidal jitter, and frequency offset of transmit and receive clocks.
  • Keywords
    Markov processes; clock and data recovery circuits; computational complexity; counting circuits; error statistics; jitter; statistical analysis; averaged bit-error rate; averaged phase picking method; clock and data recovery; computational complexity; data eye center; data stream; domain-selection process; feed-forward blind-oversampling CDR circuit; frequency offset; optimum sampling phase; periodic Markov chain representation; random jitter; receiving clock; sinusoidal jitter; statistical simulation model; transmitting clock; Bit error rate; Clocks; Computational modeling; Image edge detection; Integrated circuit modeling; Jitter; Shift registers; blind oversampling CDR; jitter tolerance; statistical methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultra Modern Telecommunications and Control Systems and Workshops (ICUMT), 2012 4th International Congress on
  • Conference_Location
    St. Petersburg
  • ISSN
    2157-0221
  • Print_ISBN
    978-1-4673-2016-0
  • Type

    conf

  • DOI
    10.1109/ICUMT.2012.6459713
  • Filename
    6459713