Title :
Quantized Conductance Of A Gate-All-Around Silicon Quantum Wire Transistor
Author :
Je, Minkyu ; Han, Sangyeon ; Kim, IIgweon ; Shin, Hyungcheol
Author_Institution :
KAIST
Keywords :
Electrons; Etching; Fabrication; Lithography; MOSFETs; Numerical analysis; Silicon; Temperature; Voltage; Wire;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 1998 International
Conference_Location :
Kyoungju, South Korea
Print_ISBN :
4-930813-83-2
DOI :
10.1109/IMNC.1998.730018
