DocumentCode :
3306824
Title :
CCD image sensor degradation by X-ray radiation
Author :
Barton, Zdenek ; Vrba, Radimir
Author_Institution :
CEDO, Ltd., Brno
fYear :
2005
fDate :
Oct. 30 2005-Nov. 3 2005
Abstract :
High image quality CCD image sensors are needed in many applications. Low noise and high dynamic range are critical parameters required in scientific and industrial applications. In many of the applications, however, the CCD image sensor can be irradiated by a ionizing radiation, as alpha, beta, gamma or X-ray. This paper describes behaviour of low noise, high dynamic range, 1 megapixel frame-transfer CCD FTT1010-M image sensor radiated by X-ray radiation. CCD image sensor driver board with rad-hard components was designed and used during the tests. Results of the investigation are used in system for protein crystalisation study in microgravity
Keywords :
CCD image sensors; X-ray effects; CCD image sensors; X-ray radiation; driver boards; frame-transfer CCD FTT1010-M image sensor; protein crystalisation; rad-hard component; Charge coupled devices; Charge-coupled image sensors; Degradation; Dynamic range; Image quality; Image sensors; Ionizing radiation; Radiation hardening; Testing; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2005 IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-9056-3
Type :
conf
DOI :
10.1109/ICSENS.2005.1597973
Filename :
1597973
Link To Document :
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