• DocumentCode
    3307068
  • Title

    Applying phase accumulation to design of transducers and measurement of acoustic loss, experiments and extended models

  • Author

    Rashidian, B. ; Rahnavard, M.

  • Author_Institution
    Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran, Iran
  • Volume
    2
  • fYear
    1997
  • fDate
    5-8 Oct 1997
  • Firstpage
    1057
  • Abstract
    A new method of formulating the core matrix of a transducer model is presented that is in the form of a translation matrix, enabling us to easily model any arbitrary collection of a group of transducers and/or acoustic loads. The validity of this formulation have been verified by performing measurements on an stack of 3 piezoceramics with different interconnection configurations. Based on the idea of phase accumulation, low frequency piezoelectric transducers have been realized using thin, high frequency piezoelectric ceramics. Compared to conventional methods (increasing the transducer bandwidth by damping), this method has proven to be superior in increasing the conversion efficiency of the transducer. In addition, there is no need for using thick piezoceramics and this is an important advantage, considering the difficulty in poling and processing of thick piezoceramics
  • Keywords
    acoustic variables measurement; loss measurement; matrix algebra; modelling; piezoceramics; piezoelectric transducers; ultrasonic transducers; LF piezoelectric transducers; acoustic loss measurement; conversion efficiency improvement; core matrix formulation; extended models; interconnection configurations; phase accumulation; piezoceramic stack; thin HF piezoelectric ceramics; transducer design; transducer model; translation matrix; Acoustic measurements; Acoustic transducers; Acoustic waves; Ceramics; Frequency; Loss measurement; Phase measurement; Piezoelectric transducers; Transmission line matrix methods; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-4153-8
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1997.661762
  • Filename
    661762