Calculations and measurements of EM field in the triple-TEM cell

Author

Xian, Zhang ; Quanxing, Jiang ; Shenhui, Jing

Author_Institution

Coll. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China

fYear

2002

fDate

17-19 Aug. 2002

Firstpage

801

Lastpage

804

Abstract

A three-dimensional cubical-grid FDTD code is used to look at unloaded field patterns versus frequency in a TTEM cell to 150 MHz. An experimental field mapping (x, y, z components) of the TTEM cell has been performed for important sections. Very good agreement is shown between measured and computed transverse plan field uniformity. The transverse electromagnetic characteristics of the cell are also discussed.

Keywords

TEM cells; computational electromagnetics; electromagnetic compatibility; electromagnetic fields; electronic equipment testing; field strength measurement; finite difference time-domain analysis; immunity testing; 150 MHz; 3D cubical-grid FDTD codes; EM field mapping; EMC testing; TTEM cell unloaded field patterns/frequencies; electromagnetic compatibility; transverse electromagnetic characteristics; transverse plan field uniformity; triple-TEM cell EM field calculations/measurements; Educational institutions; Electromagnetic compatibility; Electromagnetic measurements; Finite difference methods; Frequency; NIST; Polarization; TEM cells; Testing; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on

Print_ISBN

0-7803-7486-X

Type

conf

DOI

10.1109/ICMMT.2002.1187822

Filename

1187822