Title :
Near-zone to far-zone transform in FDTD analysis for the leakage from aperture arrays [enclosure shielding]
Author :
Lu Feiyan ; Xiao, Dan ; Sha, Fei
Author_Institution :
Electromagn. Compatibility Res. Sect., Northern JiaoTong Univ., Beijing, China
Abstract :
Aperture arrays for airflow in enclosures can become the coupling path of electromagnetic interference (EMI) from the interior to the external environment. In this paper, the relation of the leakage and aperture area is investigated numerically and experimentally in term of SE (shielding effect). In practice, the number of apertures is large and the size of a single aperture is very small compared to the wavelength. In this work, FDTD (finite-difference time-domain) modeling deals with the different number and size of apertures. To save computation effort, the pulse source and FFT is accordingly employed. The near-zone to far-zone transform is improved by integrating the numerical method and the analytical formulation. The model building approach is proved effective by a comparison of SE experimentally and numerically.
Keywords :
computational electromagnetics; electromagnetic interference; electromagnetic shielding; fast Fourier transforms; finite difference time-domain analysis; packaging; EMI interior/exterior coupling paths; EMI wavelength; FDTD analysis; FDTD modeling; FFT; SE; aperture number/size; electrical device metal enclosures; electromagnetic interference; enclosure airflow aperture arrays; enclosure aperture array leakage; fast Fourier transforms; finite-difference time-domain modeling; leakage/aperture area relation; model building; near/far-zone transforms; pulse source; shielding effect; Apertures; Computational modeling; Electromagnetic coupling; Electromagnetic interference; Finite difference methods; Frequency; Impedance; Magnetic resonance; Receiving antennas; Time domain analysis;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on
Print_ISBN :
0-7803-7486-X
DOI :
10.1109/ICMMT.2002.1187827