DocumentCode
3307405
Title
An enhanced EM method of semi-supervised classification based on Naive Bayesian
Author
Wen Han ; Xiao Nan-Feng ; Li Zhao
Author_Institution
Sch. of Comput. Sci. & Eng., Univ. of Technol., Guangzhou, China
Volume
2
fYear
2011
fDate
26-28 July 2011
Firstpage
987
Lastpage
991
Abstract
Semi-supervised learning (SSL) based on Naïve Bayesian and Expectation Maximization (EM) combines small limited numbers of labeled data with a large amount of unlabeled data to help train classifier and increase classification accuracy. With the aim of improving the efficiency problem of the basic EM algorithm, an enhanced EM method is proposed. Firstly, a feature selection function of strong category information is constructed to control the dimension of feature vector and preserve useful feature terms. Secondly, an intermediate classifier gradually transfers unlabeled documents of maximum posterior category probability to labeled collection during each iteration process of the EM algorithm. The iteration number of the enhanced EM is obviously less than the basic EM. Finally, experiments shows that the improved method obtains very effective performance in terms of macro average accuracy and algorithm efficiency.
Keywords
Bayes methods; expectation-maximisation algorithm; learning (artificial intelligence); text analysis; algorithm efficiency; automatic text classification; category information; expectation maximization method enhancement; feature selection function; feature terms; feature vector; intermediate classifier; iteration process; macro average accuracy; maximum posterior category probability; naive Bayesian; semisupervised learning; Accuracy; Bayesian methods; Classification algorithms; Educational institutions; Machine learning; Mathematical model; Text categorization; Naïve Bayesian; Semi-supervised classification; enhanced EM; feature selection;
fLanguage
English
Publisher
ieee
Conference_Titel
Fuzzy Systems and Knowledge Discovery (FSKD), 2011 Eighth International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-61284-180-9
Type
conf
DOI
10.1109/FSKD.2011.6019690
Filename
6019690
Link To Document