Title :
Numerical calculation of emissivity using bi-spectrum mode
Author :
Yuan, Wei ; Liu, Ning ; Wang, Xin ; Li, Zongqian
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
Abstract :
The principles and characteristics of a new scattering model named as bi-spectrum model (BSM) is introduced briefly in this paper. Using BSM to calculate the scattering coefficient, emissivity is calculated under different situations by using the simple relationship between scattering coefficient and emissivity. The results are compared with experimental data, also with the value calculated using the integral equation model (IEM), and validate the rationality of BSM.
Keywords :
electromagnetic wave scattering; integral equations; microwave propagation; soil; BSM; bi-spectrum mode; electromagnetic models; emissivity; integral equation model; microwave scattering; scattering coefficient; scattering model; soil; Digital communication; Electromagnetic fields; Electromagnetic modeling; Electromagnetic scattering; Fresnel reflection; Integral equations; Rough surfaces; Scanning probe microscopy; Soil moisture; Surface roughness;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2002. Proceedings. ICMMT 2002. 2002 3rd International Conference on
Print_ISBN :
0-7803-7486-X
DOI :
10.1109/ICMMT.2002.1187847
