DocumentCode :
330756
Title :
Defect vs. Nanocrystal Luminescence Emitted In Si - implanted SiO
2
Layer
Author :
Jeong, J.Y. ; Im, S. ; Oh, M.S. ; Kim, H.B. ; Chae, K.H. ; Whang, C.N. ; Song, J.H.
Author_Institution :
Yonsei University
fYear :
1998
fDate :
13-16 July 1998
Firstpage :
305
Lastpage :
306
Keywords :
Annealing; Control systems; Crystallization; Integrated circuit technology; Luminescence; Nanocrystals; Photoluminescence; Potential well; Size control; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 1998 International
Conference_Location :
Kyoungju, South Korea
Print_ISBN :
4-930813-83-2
Type :
conf
DOI :
10.1109/IMNC.1998.730094
Filename :
730094
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=330756
