DocumentCode :
330788
Title :
High temperature capability of devices on Si and wide bandgap materials
Author :
Trivedi, Malay ; Shenai, Krishna
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
Volume :
2
fYear :
1998
fDate :
12-15 Oct. 1998
Firstpage :
959
Abstract :
Technology based on Si and GaAs is not adequate to meet the requirements of high power, high temperature operation in caustic environments. Wide bandgap semiconductors are being explored for usage in such applications. In this paper, the applicability of GaN in high power semiconductor devices is evaluated with respect to similar devices based on Si and 6H-SiC. Static and transient performance at room temperature and 200/spl deg/C is compared for 6000 V devices designed on these materials. It is shown that wide bandgap materials show up an order of magnitude improvement in switching performance over Si. In addition, the potential of GaN in high power applications is clearly identified.
Keywords :
III-V semiconductors; energy gap; gallium compounds; power semiconductor diodes; power semiconductor switches; semiconductor device measurement; semiconductor device models; semiconductor device testing; 200 C; 25 C; 6000 V; GaN; GaN power semiconductor switches; high-power applications; high-temperature capability; static performance; switching performance; transient performance; wide bandgap materials; Chemical technology; Conducting materials; Gallium nitride; Photonic band gap; Power electronics; Semiconductor materials; Silicon carbide; Temperature; Voltage; Wide band gap semiconductors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location :
St. Louis, MO, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-4943-1
Type :
conf
DOI :
10.1109/IAS.1998.730261
Filename :
730261
Link To Document :
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